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涂层测厚仪
CMI760E涂层测厚仪
- 产地：英国
- 上架时间：11-12-30 17:02
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产品描述：
The CMI760 and CMI760N packages measures surface copper thickness applications to serve the quality control needs of the Printed Circuit Board industry.The CMI760 and CMI760N packages measures surface copper thickness applications to serve the quality control needs of the Printed Circuit Board industry. The package consists of a CPU unit, a probe and NIST traceable calibration standards. The probe utilizes Oxford Instruments proprietary SRP-4 microresistance technology featuring user-replaceable measurement tips for the standard (CMI760, SRP-4) or narrow (CMI760N, SRP-4N) varieties.
Measure copper thickness on PCBs
技术参数：
Measure foil or laminated copper thickness in mils, µm or copper weight (oz)
Determine electroless or electroplated Cu thickness on PCBs
Accurately quantify copper thickness after etching or planarizing
Verify copper plating thickness on PCB surface
CPU unit features a high contrast color LCD display
Memory to store up to 5000 measurements, parameters and calibrations
RS232 PC connectivity
Parallel printer port
Multi-level user password security system
Statistical data analysis with histogram, X-bar, R-chart, trend charts which can be viewed on the display or printed direct from the instrument