< 所有产品分类

涂层测厚仪

CMI233涂层测厚仪

  • 产地:英国
  • 上架时间:11-12-30 16:52
  • 产品描述
  • 技术参数
  • 技术文档
  • 相关产品
  • 如何购买

产品描述:

The CMI233 package enables control of plating and paint & powder coating processes using advanced magnetic induction and eddy-current technology.  It provides non-destructive coating thickness measurement for non-magnetic coatings over magnetic (ferrous) substrates and non-conductive coatings over conductive substrates (primarily Al, Cu as close to 100% IACS conductivity is required).  The system was specially designed to handle the needs of platers, coaters, and quality professionals. 
Three versions of the CMI233 are available:
CMI233E: Instrument, ECP eddy current probe, protective case and set of NIST traceable calibration shims
CMI233M: Instrument, SMP-2 magnetic induction probe, protective case and set of NIST traceable calibration shims
CMI233Dual: Instrument, ECP eddy current and SMP-2 magnetic induction probes, protective case and set of calibration shims
Measure non-conductive coatings over nonmagnetic conductive substrates, and conductive coatings on nonconductive substrates (Eddy Current Probes)
Non-conductors on conductors, Paint & Powder Coats on Al, Anodize on Al etc.
Measure nonmagnetic coatings over magnetic (ferrous) substrates (Magnetic Induction Probes)