The CMI153 features dual measurement technology that automatically detects either ferrous or non-ferrous substrates and then employs either magnetic induction or eddy-current technology.  Built upon our highly successful CMI150 architecture the CMI153 delivers an improved measurement probe with enhanced performance and superior substrate sensitivity. 

Useful in a wide variety of settings, the CMI153 measures non-conductive coatings over non-ferrous substrates (primarily Al, Cu as close to 100% IACS conductivity is required) and non-magnetic coatings over ferrous substrates. The system was specially designed to handle the needs of platers, coaters, and quality professionals.